Your specialist for Laser, Photonic & Nanotechnology in Switzerland
& Liechtenstein
The Photon Control spectrometers are
robust and versatile instruments, ideal for OEM integrations and core research.
The compact and high resolution spectrometers have been used to support techniques that include:
Transmission,
Reflectance,
Emission,
Fluorescence,
and Raman analysis
for investigations into the ultraviolet, visible, and near infrared regions.
Some of the applications include: LED
irradiance, Laser classification, color monitoring, and materials sorting.
Photon Control offers a comprehensive range of Spectrometer accessories and software to make OEM
integrations and complex experiments easier.
Also Stable UV and Broadband light sources like Tungsten-Halogen (350-2500nm), Deuterium-Halogen (200-1100nm)
and Mercury-Argon (250-1000nm), reflectance probes, transmission stages,
and collimating lenses are provided. Design and manufacturing custom solutions for high-volume OEM
applications, in collaboration with our partner Photon Control R&D Ltd.
The manufacture is in ISO 9001:2008 certified facilities and cleanrooms to ensure
the highest standard of quality.
The ultrafast transient absorption spectrometers of the HARPIA Series
from Light Conversion offer a slim and compact design combined with intuitive user guidance and simpler,
daily maintenance. The entire spectroscopic system is housed in a single monolithic aluminium housing,
which naturally provides excellent optical stability and minimal optical path for the interacting beams.
The HARPIA can be easily integrated into the two laser systems PHAROS/ORPHEUS and Ti:Sa/TOPAS.
The HARPIA is characterized by market-leading features, such as 10-5 resolvable signals and other unique features,
such as the ability to work at high repetition rates (up to 1 MHz) when used with the PHAROS/ORPHEUS system.
The high repetition rate enables the measurement of transient absorption dynamics with simultaneous excitation of samples with extremely low pulse energies.
(this avoids exciton destruction effects in energy transmission systems or non-linear carrier recombination in semiconductor/nanoparticle samples).
HARPIA-TA
A number of probe configurations and detection options are available starting with simple and cost effective photodiodes for single wavelength
detection and ending with spectrally-resolved broadband detection combined with white light continuum probing. Data acquisition and measurement
control are now integrated within the device itself and offer such improved detection capabilities as:
Single (sample-only) or multiple (sample and reference) integrated spectral detectors; Simple integration of any user-preferred external spectrograph;
Beam monitoring and self-recalibration capabilities (both along the optical path of the pump/probe beams and at the sample plane) and an option for
automated beam readjustment; Straightforward switching between transient absorption or transient reflection measurements;
Capability to combine both transient absorption and Z-scan experiments on the same device.
Moreover, different delay line options can be selected to cover delay windows from 2ns to 8ns and HARPIA may house either standard linear leadscrew (20mm/s)
or fast ball-screw (300mm/s) optical delay stages.
HARPIA-TB
When standard spectroscopic techniques are not enough to unravel the intricate ultrafast dynamics of photoactive systems, multi-pulse time-resolved
spectroscopic techniques can be utilized to shed additional insight. HARPIA‑TB is a third beam delivery unit for the HARPIA‑TA mainframe system that
adds an additional dimension to typical time resolved absorption measurements.
A temporally delayed auxiliary (third) laser pulse can be applied to a typical pump-probe configuration in order to perturb the on-going
pump-induced photodynamics.
An auxiliary pulse resonant to a stimulated emission transition band can deliberately depopulate the excited state species and thereby revert
the excited system back to the ground state potential energy surface.
This type of experiment is usually referred ad pump-dump-probe (PDP).
Moreover, HARPIA‑TB can be utilized to deliver frequency-narrowed (i.e., picosecond) pulses, thus providing the capability to perform time-resolved
femtosecond stimulated Raman scattering (FSRS)
spectroscopic measurements.
HARPIA-TF
HARPIA‑TF is a time-resolved fluorescence measurement extension to the HARPIA‑TA mainframe that combines two time-resolved fluorescence techniques.
For the highest time resolution, fluorescence is measured using the time-resolved fluorescence upconversion technique, where the fluorescence light emitted from the sample is sum-frequency
mixed in a nonlinear crystal with a femtosecond gating pulse from the laser. The time resolution is then limited by the duration of the gate pulse and is in the range of 250fs.
For fluorescence decay times exceeding 150 ps, the instrument can be used in time-correlated single-photon counting (TCSPC) mode that allows for measuring high-accuracy kinetic traces
in the 200ps – 2μs temporal domain. The combination of two time-resolved fluorescence techniques enables recording the full decay of fluorescence kinetics at each wavelength; with full data available,
spectral calibration of the intensity of kinetic traces taken at different wavelengths is possible, where the integral of time-resolved data is matched to a steady-state fluorescence spectrum.
High repetition rates of PHAROS laser system allows for measuring fluorescence dynamics while exciting the samples with extremely low pulse energies (thereby avoiding exciton annihilation effects
in energy transferring systems, or nonlinear carrier recombination in semiconductor/nanoparticle samples).
The SPM-002 optical bench is a proprietary crossed Czerny turner spectrometer; designed to be robust, open, and versatile.
A variety of models cover a wide range of measurement needs. The SPM-002-X is designed to be an economical
choice for price sensitive integrations or education. The SPM-002-XH is our tuned up model of the SPM-002-X, featuring
an upgraded electronics package and faster communication options. Both the SPM-002-X and SPM-002-XH use the Toshiba TC1304
CCD, and are well suited for colour and plasma monitoring; to name just a couple applications!
The SPM-002-XT64 spectrometer includes the highly sensitive, 2048×64 pixel, back thinned, Hamamatsu S11071.
This CCD features anti-blooming, and is ideally suited for sensitive reflectance applications and process monitoring;
such as fruit sorting.
The SPM-002-NIR1700 is the perfect balance between performance and cost. It features the powerful Hamamatsu G9204 in
our sensitive, compact, and cost efficient optical bench making it a valuable choice for SWIR detection.
Slit sizes of 10μm,25μm,50μm,100μm, and 200μm are available and SMA or FC fiber input are available
on all models.
The SPM-001 optical bench is a proprietary 3 dimensional bench designed to provide exceptional optical
resolution. Combined with a Toshiba TCD1304 detector, this 150mm bench can provide sub-nanometer resolution
making it an economical tool for laser classification and high resolution spectroscopy.
The TE cooled InGaAs Hamamatsu detectors are capable of measuring out to 2.5μm.
All SPM-001-X spectrometers come with a standard 10μm slit, a CCD detector, 12bit ADC, and have
exposure time ranges and temperature tolerances of 10-65s and -10 to 55°C respectively.
Alternative slit sizes of 10,25,50 and 100μm are available
The SPM-001-NIR models come in a 140mm optical bench with a standard 50μm slit, 16bit ADC, and have
exposure time ranges of 10μs to 10s. These spectrometers are fiber coupled with the choice of either
SMA or FC connectors. A fiber cable and software are included with the purchase of each spectrometer.
